materialsmetric

Materials Metric offers scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) services for atomic-resolution structural and compositional characterization of materials and nanostructures. STEM enables simultaneous imaging and analytical mapping using HAADF, BF, and EELS modes, providing unparalleled detail on crystal structure, grain boundaries, thin film interfaces, and nanoparticle architecture. These techniques are critical for advanced materials development, semiconductor research, and nanoparticle characterization. Materials Metric's electron microscopy team manages sample preparation, data acquisition, and interpretation, delivering comprehensive reports that translate complex nanoscale data into actionable scientific insights.
Scanning Transmission Microscope